FT-340 高溫四探針電阻率測試系統(tǒng)
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FT-340 高溫四探針電阻率測試系統(tǒng)的詳細資料 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
FT-351高溫四探針電阻率測試系統(tǒng) FT-351 high temperature four probe resistivity test system 一.概述:overview 采用四探針雙電組合測量方法測試方阻和電阻率系統(tǒng)與高溫箱結(jié)合配置專用的高溫四探針測試探針治具與PC軟件對數(shù)據(jù)的處理和測量控制,滿足半導體材料的電導率對溫度變化測量要求,的測控軟件實時繪制出溫度與電阻,電阻率,電導率數(shù)據(jù)的變化曲線圖譜,及過程數(shù)據(jù)值的報表分析.
Adopt four probe double electric
combination test method to test square resistance and resistivity system .
Combined with high temperature box for special high temperature four-point
probe test probe jig with PC software for data processing and measurement
control. Meet the test requirements of
the co FT-351高溫四探針電阻率測試系統(tǒng)二.適用行業(yè):Applicable industry: 廣泛用于:企業(yè)、高等院校、科研部門對導電陶瓷、硅、鍺單晶(棒料、晶片)電阻率、測定硅外延層、擴散層和離子注入層的方塊電阻以及測量導電玻璃(ITO)和其它導電薄膜等新材料方塊電阻、電阻率和電導率數(shù)據(jù).
Is widely used in: Corporate. colleges and
universities and scientific research departments of co 雙電測四探針儀是運用直線四探針雙位測量。設(shè)計符合單晶硅物理測試方法標準并參考美國 A.S.T.M 標準。
The double electric four-point probe is
used to measure the four probes in a straight line.The design co
FT-351高溫四探針電阻率測試系統(tǒng)
配套方案:解決各材料狀態(tài) --固態(tài)、液態(tài)、氣態(tài)、顆粒狀電阻、電阻率、電導率測量 |
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